Title :
Analytical model of Carbon Nanotube Field Effect Transistors for NEMS applications
Author :
Polash, Bashirul ; Huq, Hasina F.
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas-Pan America, Edinburg, TX
Abstract :
The recent developments of carbon nanotube field effect transistor (CNTFET) technology indicate the perspective of the nanoelectromechanical systems (NEMS). Carbon nanotubes (CNT) are ideal candidates for NEMS due to their chemical and physical structures, low masses and exceptional stiffness. An analytical representation of (CNT) based field effect transistor is developed for high frequency NEMS applications to examine the characteristics observed from the fabricated devices. The metal-nanotube contacts in the CNTFETs are treated as Schottky barriers and analyzed by means of a ballistic model. The famous Landauer formula is used to calculate the conductance of the tube by relating the energy dependant transmission probability within the tight binding approximation of the CNTFET. Transmission function of the CNT is expressed in terms of the Greenpsilas functions of the conductors and the coupling of the conductor leads. The Greenpsilas function is incorporated with the transfer Hamiltonian approach to calculate the tunneling currents. The non-equilibrium Greenpsilas function transport equation is solved iteratively along with a 2D Poisson equation to improve the numerical convergence. The charge density is calculated by integrating the 1D universal density-of-states along with the source-drain Fermi-Dirac distribution function over energy within the energy gap of the CNT. The calculations show that the proposed device can perform stable operation at high current levels (670 muA/mum). Upper limits of device characteristics are considered for the model. Degradation in measured data is observed due to the limitations in device fabrication technology and imperfect contact placement on the CNT.
Keywords :
Green´s function methods; Poisson equation; Schottky barriers; ballistic transport; carbon nanotubes; carrier density; convergence of numerical methods; electronic density of states; field effect transistors; high-frequency effects; iterative methods; metal-insulator boundaries; micromechanical devices; nanocontacts; nanoelectronics; nanotube devices; semiconductor device models; semiconductor device reliability; tight-binding calculations; tunnelling; 1D universal density-of-states; 2D Poisson equation; CNTFET technology; Landauer formula; Schottky barriers; analytical representation; ballistic model; carbon nanotube field effect transistors model; charge density; conductor leads; energy dependant transmission probability; energy gap; fabrication technology; high frequency NEMS applications; imperfect contact placement; iteration; metal-nanotube contacts; nanoelectromechanical systems; nonequilibrium Greenpsilas function transport equation; numerical convergence; source-drain Fermi-Dirac distribution function; stable operation; tight binding approximation; transfer Hamiltonian approach; transmission function; tunneling current calculation; Analytical models; CNTFETs; Carbon nanotubes; Chemical technology; Conductors; FETs; Frequency; Nanoelectromechanical systems; Poisson equations; Schottky barriers;
Conference_Titel :
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-2166-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2008.4616736