Title :
Inverse Integer Transform in H.264/AVC Intra-frame Encoder
Author :
Nadeem, Muhammad ; Wong, Stephan ; Kuzmanov, Georgi
Author_Institution :
Comput. Eng. Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
Real-time video compression applications such as Digital Video Camera (DVC), Television Studio Broadcast, and Surveillance video utilize the H.264/AVC video encoder in intra-only encoding mode. The H.264/AVC standard supports multiple intra-prediction modes to reduce spatial redundancy in the video frame. The intra-prediction process for a current pixels block requires the reconstructed pixels from the previously encoded blocks within the same video frame. Therefore, processing units with low latency and high-throughput are required in the processing chain of the intra-frame encoder to meet the real-time performance constraint. The inverse integer transform is on the critical path of the intra-frame encoder and is one of the compute-intensive processing unit in the intra-frame encoding loop. In this paper, for real-time video compression applications, we propose a low-latency, area-efficient and high-throughput inverse integer transform hardware architecture. The proposed design significantly reduces the latency penalty (2:67ns) of the inverse integer transform in the intra-frame processing chain. While working at clock frequency of 375 MHz, synthesized under 0:18um CMOS standard cell technology, it can easily meet the throughput requirement of real-time processing of HDTV resolutions and consumes only 7512 gates.
Keywords :
code standards; data compression; high definition television; inverse transforms; video coding; AVC; CMOS standard cell; H.264; HDTV; frequency 375 MHz; intra-frame encoder; intra-only encoding mode; inverse integer transform; size 0.18 mum; video compression; video encoder; Automatic voltage control; Encoding; Hardware; Logic gates; Pixel; Quantization; Transforms; H.264/AVC; area-efficient architecture; intra-frame encoder; inverse integer transform; low-latency;
Conference_Titel :
Electronic Design, Test and Application (DELTA), 2011 Sixth IEEE International Symposium on
Conference_Location :
Queenstown
Print_ISBN :
978-1-4244-9357-9
DOI :
10.1109/DELTA.2011.48