DocumentCode
2733814
Title
A performance metric for discrete-time chaos-based truly random number generators
Author
Beirami, Ahmad ; Nejati, Hamid ; Massoud, Yehia
Author_Institution
Electr. & Comput. Eng. Dept., Rice Univ., Houston, TX
fYear
2008
fDate
10-13 Aug. 2008
Firstpage
133
Lastpage
136
Abstract
In this paper, we develop an information entropy-based metric that represents the statistical quality of the generated binary sequence in truly random number generators (TRNG). The metric can be used for the design and optimization of the TRNG circuits as well as the development of efficient post-processing units for recovering the degraded statistical characteristics of the signal due to process variations.
Keywords
binary sequences; chaos generators; circuit optimisation; cryptography; digital circuits; entropy; random number generation; statistical analysis; TRNG circuit design; binary sequence; cryptography; discrete-time chaos; information entropy-based metrics; post-processing units; statistical quality; truly random number generators; Binary sequences; Chaos; Character generation; Circuit testing; Degradation; Design optimization; Entropy; Measurement; NIST; Random number generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location
Knoxville, TN
ISSN
1548-3746
Print_ISBN
978-1-4244-2166-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2008.4616754
Filename
4616754
Link To Document