Title :
Modeling of Frequency Dependent Losses of Transmission Lines with VHDL-AMS in Time Domain
Author :
Siebert, Kerstin ; Günther, Harald ; Frei, Stephan ; Mickisch, Wolfgang
Author_Institution :
Tech. Univ. Dortmund, Dortmund
Abstract :
A time domain model of a three conductor transmission line considering frequency depended losses, e.g. skin-effect, for the modeling language VHDL-AMS was developed. The calculation features of VHDL-AMS were considered and flexible and efficient approximations for the frequency dependent propagation and admittance functions could be implemented. The model can be used for linear and non-linear time and frequency domain simulations. It forms a basis for EMC extensions that can be implemented using the developed approximation techniques. Modern standardized modeling languages like VHDL-AMS (very high speed integrated circuit hardware description language - analog and mixed signal) have the important advantage that growing model libraries permit fast creation of complex simulation models. Exchange and extension of models is easily possible. After a short introduction and presentation of the theory used for modeling, application examples are shown. The developed model is compared to measurement results and to a lossless multiconductor transmission line model. The validity of the implemented VHDL-AMS model is proved.
Keywords :
electrical engineering computing; electromagnetic compatibility; hardware description languages; multiconductor transmission lines; skin effect; time-domain analysis; EMC extensions; VHDL-AMS; admittance function; analog and mixed signal; frequency dependent losses modeling; frequency dependent propagation; linear simulation; lossless multiconductor transmission line model; nonlinear time simulation; skin-effect; time domain analysis; very high speed integrated circuit hardware description language; Admittance; Circuit simulation; Conductors; Electromagnetic compatibility; Frequency dependence; Frequency domain analysis; Integrated circuit modeling; Propagation losses; Transmission line theory; Transmission lines;
Conference_Titel :
Electromagnetic Compatibility, 2009 20th International Zurich Symposium on
Conference_Location :
Zurich
Print_ISBN :
978-3-9523286-4-4
DOI :
10.1109/EMCZUR.2009.4783453