DocumentCode :
2733969
Title :
Purified steam for industrial thermal oxidation processes
Author :
Mack, Sebastian ; Biro, Daniel ; Wolf, Andreas ; Thaidigsmann, Benjamin ; Walczak, Alexandra ; Spiegelman, Jeffrey J. ; Preu, Ralf
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
fYear :
2010
fDate :
20-25 June 2010
Abstract :
Silicon surfaces are very effectively passivated by silicon thermal oxides. Silicon thermal oxides are grown in a dry oxygen atmosphere or in steam, whereas the thermal oxide growth rate is about one order of magnitude higher for a steam ambient. This considerably reduces the process time and cost. State of the art pyrox systems generate steam by pyrolysis of hydrogen and oxygen gas. A new approach is the purification of vaporized deionized water. In this work, we present a direct comparison of both systems. Additionally both systems are connected to the same quartz oxidation tube. The higher steam saturation of the steam purifying device results in a 20% higher growth rate. Nevertheless, on low resistivity p-type substrates, after a forming gas anneal an excellent surface recombination velocity of around 25 cm/s is found for thermal oxides grown with each of the systems. Moreover, 110 μm thick thermal oxide rear surface passivated silicon solar cells show similar efficiencies of 18%, irrespective of the applied steam generation technology.
Keywords :
boilers; passivation; pyrolysis; surface recombination; water treatment; Si; dry oxygen atmosphere; industrial thermal oxidation; low resistivity p-type substrates; purified steam; pyrolysis; pyrox systems; quartz oxidation tube; silicon surface passivation; silicon thermal oxides; size 110 mum; steam generation; surface recombination velocity; thermal oxide growth rate; vaporized deionized water purification; Europe; Silicon; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614171
Filename :
5614171
Link To Document :
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