Title :
Reliability Study for Test Lands Targeting during Electrical Testing
Author :
Han, Lei ; Voloshin, Arkady
Author_Institution :
Central South Univ., Changsha
Abstract :
Theoretical analysis and experimental observation of tolerance distribution in bed-of-nails fixture were made for its reliability in testing. A systematic, accurate and robust evaluating method for printed circuit board (PCB) positioning assessment in testing fixture was developed. Actual deformation of PCB could be obtained based upon a reasonable mode. The combined accuracy of the test lands position targeting (false failure rate or overlapping rate of probe/test lands) were estimated by Weibull model. Results will be helpful for reliability analysis of the PCB test fixtures
Keywords :
Weibull distribution; printed circuit testing; reliability; PCB deformation; Weibull model; bed-of-nails fixture; electrical testing; printed circuit board; reliability analysis; test fixtures; test lands position; tolerance distribution; Circuit testing; Fixtures; Manufacturing; Printed circuits; Probes; Robustness; Statistical analysis; System testing; Tail; Weibull distribution; PCB deformation; Weibull distribution; test lands; testing fixture;
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9292-2
Electronic_ISBN :
0-7803-9293-0
DOI :
10.1109/HDP.2005.251372
