DocumentCode
2734140
Title
All screen-printed industrial n-type Czochralski silicon solar cells with aluminium rear emitter and selective front surface field
Author
Meyer, K. ; Schmiga, C. ; Jesswein, R. ; Dupke, M. ; Lossen, J. ; Krokoszinski, H.-J. ; Hermle, M. ; Glunz, S.W.
Author_Institution
Bosch Solar Energy AG, Erfurt, Germany
fYear
2010
fDate
20-25 June 2010
Abstract
The influence of the base dopand on the cell performance in a cell type with selective front phosphorus diffusion and an alloyed aluminum rear doping is investigated in this work. First this was done by using two dimensional device simulations to vary the doping species (n- or p-type) and the concentration over a broad range. For n-type base material we found that for a given front side system (diffusion and passivation) the fill factor tends to increase while the short circuit current decreases with increasing base doping concentration. The ideal base doping is therefore a function of the quality of the front side diffusion and passivation. In comparison to the n-type cells the dependence of the p-type cell results on the base doping concentration is much weaker. Based on the simulations a base doping concentration of 8 □cm was chosen to process n-type solar cells, which were then compared with identically processed p-type cells. For our front and rear screen-printed large-area n- as well as for our p-type cells we have achieved efficiencies up to 17.6 %.
Keywords
crystal growth from melt; diffusion; doping profiles; elemental semiconductors; passivation; short-circuit currents; silicon; solar cells; Czochralski silicon solar cells; Si; alloyed aluminum; aluminium rear emitter; doping concentration; n-type solar cells; passivation; phosphorus diffusion; screen-printed solar cells; selective front surface field; short circuit current; Doping; Photovoltaic cells; Resistance; Semiconductor process modeling; Short circuit currents; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614183
Filename
5614183
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