Title :
Key Learning from Quanta ICT Low resistance Failure Issue
Author_Institution :
Intel Products (Shanghai) Ltd., Shanghai
Abstract :
Quanta reported high failure due to Montara ICT low resistance. The issue is described in details, as well as the solving procedure. Some of the key learning is shared
Keywords :
failure analysis; integrated circuit testing; Montara ICT low resistance; Quanta; low resistance failure issue; solving procedure; Circuit testing; Customer satisfaction; Data engineering; Degradation; Electrical resistance measurement; Page description languages; Quality management; Switches; Switching circuits; Trade agreements;
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9292-2
Electronic_ISBN :
0-7803-9293-0
DOI :
10.1109/HDP.2005.251375
