Title :
Mechanics of Interfacial Delamination in IC Packages Undergoing Solder Reflow
Author_Institution :
Dept. of Mech. Eng., Singapore Nat. Univ.
Abstract :
When plastic packages undergo solder reflow after being subjected to moisture preconditioning, hygrothermal stresses are induced in the package. If these stresses are excessive popcorning failure will occur. It has been shown that popcorning failure is usually preceded by delamination of either the pad/encapsulant interface or the die-attach-layer/pad interface. Fracture mechanics methodology has been shown to be a useful technique for analysing and predicting the onset of delamination. This paper describes an investigation on the mechanics of delamination at interfaces in typical plastic IC packages
Keywords :
delamination; failure analysis; fracture mechanics; integrated circuit packaging; interface phenomena; plastic packaging; reflow soldering; thermal stresses; IC packages; fracture mechanics methodology; hygrothermal stresses; interfacial delamination; moisture preconditioning; plastic packages; popcorning failure; solder reflow; Delamination; Finite element methods; Heat transfer; Integrated circuit packaging; Mechanical factors; Moisture; Plastic integrated circuit packaging; Plastic packaging; Temperature; Thermal stresses;
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9292-2
Electronic_ISBN :
0-7803-9293-0
DOI :
10.1109/HDP.2005.251380