DocumentCode
2734343
Title
Interface Modelling of ACA Interconnects Using Micropolar Theory
Author
Zhang, Yan ; Larsson, Ragnar ; Fan, Jing-Yu ; Liu, Johan
fYear
2005
fDate
27-29 June 2005
Firstpage
1
Lastpage
5
Abstract
The contribution focuses on applying micropolar theory which, as compared to the classical continuum theory, can offer the possibility to include e.g. a microstructural size-effect for the simulation and prediction of the interfacial stresses of microsystem interconnections, such as anisotropically conductive adhesives. As the dimension of the adhesive is much smaller than the chip or the substrate, it is treated as an interface zone with a finite thickness. The micro-polar theory is used in the vicinity of the interface to model the transfer of the couple stress across the interface, and a degenerated micropolar continuum to model the interface, across which a displacement and a rotational jump is regularized. The paper is concluded by a numerical example involving the FE-representation of the interface formulation
Keywords
composite material interfaces; conductive adhesives; continuum mechanics; electronics packaging; finite element analysis; integrated circuit interconnections; polymers; thermal stresses; ACA interconnects; FE representation; anisotropically conductive adhesives; classical continuum theory; interface modelling; interfacial stresses; micro-structural size effect; micropolar theory; microsystem interconnections; Anisotropic magnetoresistance; Assembly; Composite materials; Conducting materials; Conductive adhesives; Delamination; Temperature; Thermal conductivity; Thermal degradation; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
Conference_Location
Shanghai
Print_ISBN
0-7803-9292-2
Electronic_ISBN
0-7803-9293-0
Type
conf
DOI
10.1109/HDP.2005.251385
Filename
4017426
Link To Document