DocumentCode :
2734461
Title :
High Performance Anistropic Conductive Adhesives for Lead-free Interconnects
Author :
Li, Yi ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2005
fDate :
27-29 June 2005
Firstpage :
1
Lastpage :
7
Abstract :
To improve the electrical property of the anisotropic conductive adhesive (ACA) joints, self-assembled monolayer (SAM) compounds are introduced into the interface between the metal filler and the substrate bond pad. The formation of the SAM on gold and silver and the thermal stability were investigated by measuring the contact angles of SAM compounds with a hydrophilic or hydrophobic tail groups such as octadecanethiol (ODT), mercpatoacetic acid (MAA), 1,4-benzenedithiol (dithiol) and malonic acid (Acid M) on Au and/or Ag surfaces. Epoxy resins with two different curing temperatures were used as polymer matrices of the ACA formulations. SAM treated ACA joints showed much lower resistance at the same applied current than non-treated joints, and the effect on the low curing temperature epoxy matrices was more significant. Nano-Ag filled ACA showed more significant improvement of electrical properties due to the more surface area and higher surface energy of nano particles and consequently the higher thermal stability with SAM
Keywords :
conductive adhesives; curing; gold; interconnections; monolayers; polymers; silver; thermal stability; Ag; Au; anistropic conductive adhesives; contact angles; curing temperature; electrical property; epoxy resins; hydrophilic group; hydrophobic tail groups; lead free interconnects; metal filler; self assembled monolayer; substrate bond pad; thermal stability; Anisotropic magnetoresistance; Bonding; Conductive adhesives; Curing; Environmentally friendly manufacturing techniques; Gold; Surface resistance; Surface treatment; Temperature; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2005 Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9292-2
Electronic_ISBN :
0-7803-9293-0
Type :
conf
DOI :
10.1109/HDP.2005.251391
Filename :
4017432
Link To Document :
بازگشت