DocumentCode :
2734595
Title :
Measuring degradation rates without irradiance data
Author :
Pulver, Steve ; Cormode, Daniel ; Cronin, Alex ; Jordan, Dirk ; Kurtz, Sarah ; Smith, Ryan
Author_Institution :
Univ. of Arizona, Tucson, AZ, USA
fYear :
2010
fDate :
20-25 June 2010
Abstract :
A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.
Keywords :
Bayes methods; photovoltaic power systems; statistical analysis; Bayesian statistical analysis; PV systems; daily AC final yields; irradiance data; photovoltaic system degradation rates; relative degradation rates; Area measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614208
Filename :
5614208
Link To Document :
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