DocumentCode
2734753
Title
An extended two-port method for the determination of the base and emitter resistance
Author
Huszka, Z. ; Seebacher, E. ; Pflanzl, W.
Author_Institution
Austriamicrosystems AG, Unterpremstatten, Germany
fYear
2005
fDate
9-11 Oct. 2005
Firstpage
188
Lastpage
191
Abstract
An approach exploiting the joint information in h11 and h21 is suggested for extracting the base and emitter resistance of bipolar transistors. Based on the complete small signal equivalent, robust formulae are presented capturing all error terms that may have influence on the result.
Keywords
electric resistance measurement; equivalent circuits; heterojunction bipolar transistors; semiconductor device measurement; base resistance; bipolar transistors; emitter resistance; extended two-port method; Analytical models; Bipolar transistors; Capacitance; Data mining; Equivalent circuits; Frequency; Hydrogen; Impedance; Noise robustness; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Print_ISBN
0-7803-9309-0
Type
conf
DOI
10.1109/BIPOL.2005.1555229
Filename
1555229
Link To Document