Title :
20 GHz bipolar RF RMS power detectors
Author :
Zhang, Tao ; Eisenstadt, William R. ; Fox, Robert M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
A peak/RMS power detector with up to 20 GHz bandwidth and ≥ 40 dB dynamic range is presented. The design is based on cascading several stages of attenuators and detectors. Analysis shows that the Meyer detector, originally developed as a peak detector, can be used for RMS detection over an approximately 20 dB range, comparable to the popular RF/microwave diode detector. The new cascaded structure extends the dynamic range for RMS detection, providing a circuit suitable for applications including embedded RFIC test.
Keywords :
bipolar transistors; built-in self test; integrated circuit testing; microwave detectors; peak detectors; radiofrequency integrated circuits; 20 GHz; Meyer detector; RF detector; RMS power detector; attenuators; bipolar RF RMS power detectors; bipolar transistor; built-in-self test; embedded RFIC test; microwave diode detector; peak detector; Bandwidth; Bipolar transistors; Circuit testing; Dynamic range; Electromagnetic measurements; Envelope detectors; Power measurement; Radio frequency; Schottky diodes; Semiconductor diodes;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the
Print_ISBN :
0-7803-9309-0
DOI :
10.1109/BIPOL.2005.1555232
