• DocumentCode
    2734874
  • Title

    Advances in quantum dot intermediate band solar cells

  • Author

    Antolín, E. ; Martí, A. ; Linares, P.G. ; Ramiro, I. ; Hernández, E. ; Farmer, C.D. ; Stanley, C.R. ; Luque, A.

  • Author_Institution
    Inst. de Energia Solar, Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Several groups have reported on intermediate band solar cells (IBSC) fabricated with InAs/GaAs quantum dots (QD) which exhibit quantum efficiencies (QE) for sub-bandgap photon energies. However, this QE is produced by the absorption of photons only through valence band (VB) to intermediate band (IB) transitions. The absorption of photons of that energy in IB to conduction band (CB) transitions is weak and is usually replaced by carrier escape. This mechanism is incompatible with the preservation of the output voltage, and therefore, it cannot lead to the high efficiencies predicted by the IBSC model. In this work, we discuss the contribution of thermal and tunneling mechanisms to IB-CB carrier escape in current QD-IBSCs. It is experimentally demonstrated that in QD-IBSC prototypes where tunnel escape has been eliminated, the sub-bandgap QE is suppressed at sufficiently low temperatures, and when this occurs, the only limit for the open-circuit voltage (VOC) is the fundamental semiconductor bandgap, as stated by the IBSC theoretical model.
  • Keywords
    energy gap; gallium arsenide; indium compounds; semiconductor quantum dots; solar cells; valence bands; InAs-GaAs; QD-IBSC prototypes; intermediate band solar cells; intermediate band transition; open-circuit voltage; photon absorption; quantum dot; semiconductor bandgap; sub-bandgap QE; sub-bandgap photon energy; tunneling mechanism; valence band transition; Absorption; Gallium arsenide; Photonic band gap; Photonics; Photovoltaic cells; Temperature measurement; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614224
  • Filename
    5614224