Title :
In situ quantification of genomic instability in breast cancer progression
Author :
De Solórzano, C. Ortiz ; Chin, K. ; Gray, J.W. ; Lockett, S.J.
Author_Institution :
Life Sci. Div., Lawrence Berkeley Nat. Lab., CA, USA
Abstract :
Genomic instability is a hallmark of breast and other solid cancers. Presumably caused by critical telomere reduction, GI is responsible for providing the genetic diversity required in the multistep progression of the disease. We have used multicolor fluorescence in situ hybridization and 3D image analysis to quantify genomic instability cell-by-cell in thick, intact tissue sections of normal breast epithelium, preneoplastic lesions (usual ductal hyperplasia), ductal carcinona in situ or invasive carcinoma of the breast. Our in situ-cell by cell-analysis of genomic instability shows an important increase of genomic instability in the transition from hyperplasia to in situ carcinoma, followed by a reduction of instability in invasive carcinoma. This pattern suggests that the transition from hyperplasia to in situ carcinoma corresponds to telomere crisis and invasive carcinoma is a consequence of telomerase reactivation after telomere crisis.
Keywords :
cancer; cellular biophysics; fluorescence; genetics; image segmentation; medical image processing; tumours; 3D image analysis; 3D image segmentation; breast cancer progression; cell by cell-analysis; critical telomere reduction; disease multistep progression; ductal carcinona; ductal hyperplasia; genetic diversity; genomic instability quantification; in situ hybridization; intact tissue sections; invasive carcinoma; multicolor fluorescence; normal breast epithelium; preneoplastic lesions; presumably; solid cancers; telomerase reactivation; telomere crisis; Bioinformatics; Biological cells; Breast cancer; Diseases; Genetics; Genomics; Image analysis; Image segmentation; Laboratories; Marine animals;
Conference_Titel :
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
Print_ISBN :
0-7803-7789-3
DOI :
10.1109/IEMBS.2003.1280926