• DocumentCode
    2734944
  • Title

    Application of magnetic metal thin films to EMI noise filter

  • Author

    Takei, Koji ; Ishii, Osamu ; Senda, Masakatsu

  • Author_Institution
    Interdisciplinary Res. Labs., NTT, Ibaraki, Japan
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    508
  • Lastpage
    510
  • Abstract
    We demonstrate the applicability of magnetic metal thin films to an electromagnetic interference (EMI) noise filter. We examine the magnetic loss of three kinds of thin films consisting of roll-pressed Ni-Fe, sputtered Ni-Fe and roll-cooled amorphous Co-Fe-Si-B. Impedance measurement reveals that the magnetic loss of these metals becomes higher as their permeability increases. The noise reduction characteristic of thin film filters is evaluated by the S-parameter measurement technique. We can obtain the same noise reduction as a conventional ferrite filter with a thin film filter of 1/30-1/7 its volume. These results indicate that the use of magnetic metal thin films is advantageous with regard to minimizing noise filter size
  • Keywords
    S-parameters; electric impedance measurement; electromagnetic interference; interference suppression; magnetic multilayers; magnetic thin film devices; noise; permeability; soft magnetic materials; Co-Fe-Si-B; EMI noise filter; Ni-Fe; S-parameter measurement; electromagnetic interference; ferrite filter; impedance measurement; magnetic loss; magnetic metal thin films; multilayered film; noise reduction characteristic; permeability; radiated emissions; roll-cooled amorphous Co-Fe-Si-B; roll-pressed Ni-Fe; soft magnetic metal materials; sputtered Ni-Fe; thin film filter; Amorphous magnetic materials; Amorphous materials; Electromagnetic interference; Filters; Magnetic films; Magnetic losses; Magnetic noise; Magnetic separation; Noise reduction; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561423
  • Filename
    561423