Accuracy analysis of the parallel composition for the block diagram based reliability assessment of quantum circuits

Author

Boncalo, O. ; Vladutiu, M. ; Amaricai, A.

Author_Institution

Comput. Sci. & Eng. Dept., Univ. Politeh. of Timisoara, Timisoara, Romania

fYear

2010

fDate

27-29 May 2010

Firstpage

355

Lastpage

359

Abstract

Simulation cannot be applied for complex quantum circuits´ reliability analysis. Therefore, mixed simulation - analytical techniques should be applied in order to evaluate the reliability of quantum devices. One of the most used analytical methods is represented by the reliability block diagrams (RBD). This paper presents the accuracy estimates analysis for the parallel composition in the RBD based reliability estimation for quantum circuits. We analyze the influence of the idle qubit block size on and the influence of the idle qubit interleaving on the relative error. The obtained results will be used in accuracy estimation of the mixed simulation-RBD methodology for reliability assessment of quantum circuits.

Keywords

circuit reliability; quantum computing; accuracy analysis; idle qubit block size; idle qubit interleaving; mixed simulation analytical technique; parallel composition; quantum circuit; relative error; reliability assessment; reliability block diagram; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Costs; Interleaved codes; Process design; Quantum computing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Cybernetics and Technical Informatics (ICCC-CONTI), 2010 International Joint Conference on

Conference_Location

Timisoara

Print_ISBN

978-1-4244-7432-5

Type

conf

DOI

10.1109/ICCCYB.2010.5491248

Filename

5491248