A dynamic-Element-Matching architecture using individual element error shaping

Dynamic-element-matching (DEM) techniques are used to reduce distortions in multi-bit digital-to-analog-converters (DACs), which occur due to the static level mismatch of the switching elements. The common design strategy of established DEM algorithms is to shape the produced mismatch error signal by targeting a uniform usage of the DAC switching elements. In this paper a novel DEM technique is presented, which derives data dependent error signals for each element and shapes their spectra by using delta-sigma modulation techniques. Since the derived data dependent error signals are precisely proportional to the real error signals also for large sample values, this element error shaping DEM algorithm (EES-DEM) is well suited to deal with signals with DC-content and large amplitudes.