Title :
The etchback selective emitter technology and its application to multicrystalline silicon
Author :
Book, F. ; Braun, S. ; Herguth, A. ; Dastgheib-Shirazi, A. ; Raabe, B. ; Hahn, G.
Author_Institution :
Dept. of Phys., Univ. of Konstanz, Konstanz, Germany
Abstract :
We have developed a simple and industrially applicable selective emitter cell process using only one diffusion step and an emitter etchback to create the high sheet resistance emitter. The process generates a deeper doping profile with a lower surface phosphorous concentration than a directly diffused emitter with the same sheet resistance. This results in an extremely low emitter saturation current j0E even at a moderate sheet resistance of 60-80 Ω/□. The highest independently confirmed cell efficiency on Cz-Si (146 cm2) was 18.7%. In this work the etching behavior of the acidic solution at the grain boundaries is studied by SEM imaging and high resolution LBIC measurements at 405 nm wavelength. The etchback also leads to a change in reflectivity, which is quantified by reflectance measurements. We furthermore investigate the influence of the base material quality on the gain that can be achieved by this process. Large area solar cells have been processed from solar grade and UMG mc silicon.
Keywords :
elemental semiconductors; etching; grain boundaries; semiconductor doping; silicon; solar cells; SEM imaging; Si; acidic solution; applicable selective emitter cell process; base material quality; diffusion step; directly diffused emitter; doping profile; emitter etchback; emitter saturation current; etchback selective emitter technology; etching behavior; grain boundaries; high resolution LBIC measurements; high sheet resistance emitter; large area solar cells; multicrystalline silicon; reflectance measurements; solar grade; surface phosphorous concentration; wavelength 405 nm; Etching; Grain boundaries; Photovoltaic cells; Resistance; Silicon; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5614267