Title :
Crystal parameter measurement using a network/spectrum/impedance analyzer
Author :
Morley, P.E. ; Marshall, R.J.T. ; Williamson, R.J.
Author_Institution :
STC Components, Harlow, UK
Abstract :
A suite of computer programs has been developed which utilises a single instrument to perform most of the measurements required for crystal resonators. This includes a precision technique for characterization of the equivalent circuit parameters (which can also be extended for measurements over a range of temperature), a spurious response test and a means of selecting crystals for drive level dependence. The modules are designed for use in a production environment, so speed and simplicity of operation are of the highest importance
Keywords :
automatic test equipment; crystal resonators; equivalent circuits; production testing; quartz; SiO2 resonators; characterization; crystal parameter measurement; crystal resonators; drive level dependence; equivalent circuit parameters; network/spectrum/impedance analyzer; precision technique; production environment; production testing; simplicity of operation; single instrument; spurious response test; suite of computer programs; temperature dependence;
Conference_Titel :
Frequency Control and Synthesis, 1989. Second International Conference on
Conference_Location :
Leicester
