Title :
Symmetry detection for automatic analog-layout recycling
Author :
Bourai, Youcef ; Shi, C. J Richard
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
Layout symmetry is used to minimize the impact of mismatch on the performance of analog circuits. In this paper, an efficient algorithm is presented to detect automatically the mask layout symmetry. It consists of identifying signal nets, isolating circuit devices and detecting their symmetry, and finally, synthesizing the layout symmetry. Combined with layout compaction with symmetry constraints, this technique provides a methodology for automatic analog-layout recycling
Keywords :
analogue integrated circuits; circuit layout CAD; computational complexity; integrated circuit layout; masks; automatic analog-layout recycling; complexity analysis; efficient algorithm; layout compaction; mask layout symmetry; signal nets identification; symmetry constraints; symmetry detection; Analog circuits; Application specific integrated circuits; Compaction; Integrated circuit synthesis; Integrated circuit technology; Recycling; Signal processing; Signal synthesis; Technological innovation; Tiles;
Conference_Titel :
Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific
Conference_Location :
Wanchai
Print_ISBN :
0-7803-5012-X
DOI :
10.1109/ASPDAC.1999.759663
