DocumentCode
2735542
Title
Towards fully integrated high temperature wireless sensors using GaN-based HEMT devices
Author
Huque, Mohammed Aminul ; Islam, Syed Kamrul ; Kuruganti, Phani Teja
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN
fYear
2008
fDate
10-13 Aug. 2008
Firstpage
582
Lastpage
585
Abstract
Wireless sensors that are capable of working in extreme environments can significantly improve the efficiency and performance of industrial processes by facilitating better monitoring and control. Gallium nitride (GaN), a widely researched wide bandgap material, can potentially be used to fabricate components for sensing and actuation for high temperature integrated wireless sensors. In this paper we are presenting an experimental study on the performance of AlGaN/GaN HEMT at high temperatures (up to 300degC). From test results, DC and microwave parameters at different temperatures were extracted.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device testing; sensors; wide band gap semiconductors; AlGaN-GaN; high electron mobility transistors; integrated wireless sensors; semiconductor device testing; Aluminum gallium nitride; Gallium nitride; HEMTs; III-V semiconductor materials; Industrial control; Monitoring; Photonic band gap; Temperature sensors; Testing; Wireless sensor networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
Conference_Location
Knoxville, TN
ISSN
1548-3746
Print_ISBN
978-1-4244-2166-4
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2008.4616866
Filename
4616866
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