• DocumentCode
    2735542
  • Title

    Towards fully integrated high temperature wireless sensors using GaN-based HEMT devices

  • Author

    Huque, Mohammed Aminul ; Islam, Syed Kamrul ; Kuruganti, Phani Teja

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN
  • fYear
    2008
  • fDate
    10-13 Aug. 2008
  • Firstpage
    582
  • Lastpage
    585
  • Abstract
    Wireless sensors that are capable of working in extreme environments can significantly improve the efficiency and performance of industrial processes by facilitating better monitoring and control. Gallium nitride (GaN), a widely researched wide bandgap material, can potentially be used to fabricate components for sensing and actuation for high temperature integrated wireless sensors. In this paper we are presenting an experimental study on the performance of AlGaN/GaN HEMT at high temperatures (up to 300degC). From test results, DC and microwave parameters at different temperatures were extracted.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device testing; sensors; wide band gap semiconductors; AlGaN-GaN; high electron mobility transistors; integrated wireless sensors; semiconductor device testing; Aluminum gallium nitride; Gallium nitride; HEMTs; III-V semiconductor materials; Industrial control; Monitoring; Photonic band gap; Temperature sensors; Testing; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. MWSCAS 2008. 51st Midwest Symposium on
  • Conference_Location
    Knoxville, TN
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-2166-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2008.4616866
  • Filename
    4616866