Title :
An IEEE 1149.1 based test access architecture for ICs with embedded cores
Author_Institution :
Texas Instrum., USA
Abstract :
This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores
Keywords :
IEEE standards; automatic test equipment; automatic testing; built-in self test; computer architecture; digital integrated circuits; integrated circuit design; integrated circuit testing; IC testing; IEEE 1149.1; Texas Instruments; embedded cores; hierarchical test access; test access architecture; Built-in self-test; Circuit testing; Clocks; Emulation; Instruments; Integral equations; Integrated circuit testing; Pins; Registers; System testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639596
