DocumentCode
2735724
Title
An application of zero-suppressed binary decision diagrams to clustering analysis of DNA microarray data
Author
Yoon, Sungroh ; De Micheli, Giovanni
Author_Institution
Comput. Syst. Lab., Stanford Univ., CA, USA
Volume
2
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
2925
Lastpage
2928
Abstract
Clustering has been one of the most popular techniques to analyze gene expression data. The biclustering method is two-dimensional clustering of genes and experimental conditions to identify a group of genes that display a coherent behavior in some conditions. Although this method may provide additional insight overlooked by traditional clustering techniques, it is often computationally expensive to perform biclustering on practical gene expression data. In this work, we propose a novel biclustering technique that exploits the zero-suppressed binary decision diagrams (ZBDDs) to cope with such a computational challenge. The ZBDDs are a variant of the reduced ordered binary decision diagrams that have found a widespread use in optimization and verification of VLSI digital circuits. Our experimental results demonstrate that the ZBDDs can indeed extend the scalability of our biclustering algorithm substantially, thus enabling us to apply it to a wider spectrum of gene expression data.
Keywords
DNA; binary decision diagrams; biology computing; cellular biophysics; genetics; molecular biophysics; pattern clustering; statistical analysis; unsupervised learning; DNA microarray data; VLSI digital circuits; biclustering algorithm; clustering analysis; gene expression data; unsupervised learning techniques; zero-suppressed binary decision diagrams; Application software; Boolean functions; Clustering methods; DNA; Data analysis; Data structures; Gene expression; Genetics; Technological innovation; Unsupervised learning; Clustering; ZBDD; gene expression analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403831
Filename
1403831
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