DocumentCode :
2735747
Title :
Piezoelectric characteristic length
Author :
Ballato, A. ; Gualtieri, J.G. ; Kosinski, J.A.
Volume :
2
fYear :
1994
fDate :
Oct. 31 1994-Nov. 3 1994
Firstpage :
745
Abstract :
Piezoelectric crystal resonators for frequency control and ultrasonic applications are often judged by a number of differing metrics, depending upon the intended application. Acoustic quality factor, Q, and electromechanical coupling factor, k, are two most often used. None of the usual performance figures is entirely adequate for characterizing resonators for applications at high frequencies. This paper describes various metrics traditionally applied to resonators. It tabulates observed values for each performance metric for both mature materials such as quartz and lithium niobate, as well as newer substances like langasite and thin-film aluminum nitride. An entirely new metric, with dimensions of a characteristic length is then introduced, and tabulated. It rationalizes the judging of material suitability for high frequency resonator use. The new measure is a combination of all of the physical quantities normally associated with acoustic waves in piezoelectric crystals: mass density, dielectric permittivity, piezoelectric modulus, elastic stiffness and viscosity. Use of the new performance figure leads to a number of counterintuitive conclusions regarding future directions for research, and suggests unobvious emphases for the future technology
Keywords :
Q-factor; acoustic resonators; crystal resonators; frequency control; permittivity; acoustic quality factor; dielectric permittivity; elastic stiffness; electromechanical coupling factor; frequency control; high frequency resonator; mass density; performance metric; piezoelectric characteristic length; piezoelectric crystal resonators; piezoelectric modulus; ultrasonic applications; viscosity; Acoustic resonators; Frequency control; Permittivity; Piezoelectric resonators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1994. Proceedings., 1994 IEEE
Conference_Location :
Cannes, France
Print_ISBN :
0-7803-2012-3
Type :
conf
DOI :
10.1109/ULTSYM.1994.401751
Filename :
401751
Link To Document :
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