A single-chip CMOS CCD camera interface circuit with digitally controlled AGC

Author

Lee, Jin-Kug ; Chang, Dong-Young ; Kang, Geun-Soon ; Lee, Seung-Hoon

Author_Institution

Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea

fYear

1999

fDate

18-21 Jan 1999

Firstpage

45

Abstract

This paper describes a single-chip solution for CMOS CCD camera interface systems. The required AGC gain in the proposed circuit is controlled directly by digital bits without conventional extra DAC´s. Nonlinear errors such as offsets in signal paths are automatically removed during black-level correction. The AGC outputs are transferred to a 10 b on-chip ADC. The prototype implemented in a 0.5 μm n-well CMOS process shows the 32-dB AGC dynamic range CMOS process shows the 32-dB AGC dynamic range in 1/8-dB step with 173 mW at 3 V and 25 MHz

Keywords

CCD image sensors; CMOS integrated circuits; analogue-digital conversion; automatic gain control; mixed analogue-digital integrated circuits; signal sampling; 0.5 micron; 10 bit; 173 mW; 25 MHz; 3 V; AGC gain; CCD camera interface circuit; black-level correction; digitally controlled AGC; dynamic range CMOS process; n-well CMOS process; on-chip ADC; signal paths; single-chip CMOS CCD camera; Automatic control; CMOS digital integrated circuits; CMOS image sensors; CMOS process; Charge coupled devices; Charge-coupled image sensors; Digital cameras; Digital control; Dynamic range; Error correction;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific

Conference_Location

Wanchai

Print_ISBN

0-7803-5012-X

Type

conf

DOI

10.1109/ASPDAC.1999.759706

Filename

759706