Title :
Towards industrially feasible high-efficiency n-type Si solar cells with boron-diffused front side emitter - combining firing stable Al2O3 passivation and fine-line printing
Author :
Richter, A. ; Hoteis, M. ; Benick, J. ; Henneck, S. ; Hermle, M. ; Glunz, S.W.
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
Abstract :
In this work we combine the firing stable Al2O3 passivation of a boron emitter with an industrially feasible contacting technology to gain a complete front side concept of n-type silicon solar cells with a front side junction. The contact scheme consists of a fine-line printed seed layer, using a silver ink, which is subsequently fired and plated. We studied the contact formation of the applied seed layer on a shallow, industrial-type boron emitter by measuring the specific contact resistance for different firing processes. To gain a deeper insight into the contact formation, SEM micrographs were made from the contact interface. Moreover, the emitter shunting has been studied by firing p+nn+ test structures at temperatures between 700 and 850 °C. Regarding the passivation of the boron emitter, the firing stability of an Al2O3/SiNx layer stack was investigated on symmetrically processed p+np+ lifetime samples for the same firing temperature range. Based on these results, p+nn+ solar cells have been fabricated, featuring a full-area, phosphorous-doped back surface field at the rear. Conversion efficiencies up to 20.5% and fill factors of 80.8% could be achieved, demonstrating the high-efficiency contact formation to the boron-doped emitter.
Keywords :
alumina; contact resistance; elemental semiconductors; passivation; silicon; solar cells; Al2O3; Si; boron emitter; contact formation; contact interface; contact resistance; fine-line printed seed layer; front side emitter; front side junction; n-type silicon solar cells; passivation; temperature 700 degC to 850 degC; Aluminum oxide; Boron; Firing; Passivation; Photovoltaic cells; Temperature measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-5890-5
DOI :
10.1109/PVSC.2010.5614369