Title :
A 142dB Dynamic Range CMOS Image Sensor with Multiple Exposure Time Signals
Author :
Park, Jong-Ho ; Mase, Mitsuhito ; Kawahito, Shoji ; Sasaki, Masaaki ; Akamori, Yasuo ; Ohta, Yukihiro
Author_Institution :
Graduate Sch. of Electron. Sci. & Technol., Shizuoka Univ., Jouhoku
Abstract :
An ultra wide dynamic range image sensor with a linear response is presented. The proposed extremely short accumulation (ESA) signal readout technique enables the dynamic range of image sensor to be expanded up to 142dB. Including the ESA signals, total of 4 different accumulation time signals are read out in one frame based on burst readout mode. To achieve the high-speed readout required for the multiple exposure signals, column parallel A/D converters are integrated at the upper and lower sides of pixel array. The improved column parallel cyclic 12-b ADC with a built-in CDS circuit has the differential non-linearity of plusmn0.3LSB
Keywords :
CMOS image sensors; analogue-digital conversion; 12 bit; CMOS image sensor; accumulation time signals; built-in CDS circuit; burst readout mode; column parallel A/D converters; extremely short accumulation signal readout; linear response; multiple exposure time signals; CMOS image sensors; CMOS technology; Capacitors; Dynamic range; Educational institutions; Image sensors; Lighting; Noise reduction; Pixel; Timing;
Conference_Titel :
Asian Solid-State Circuits Conference, 2005
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-9163-2
Electronic_ISBN :
0-7803-9163-2
DOI :
10.1109/ASSCC.2005.251813
