DocumentCode :
2736343
Title :
Bayesian networks of BI-RADS™ descriptors for breast lesion classification
Author :
Fischer, E.A. ; Lo, J.Y. ; Markey, M.K.
Author_Institution :
Dept. of Biomed. Eng., Texas Univ., Austin, TX, USA
Volume :
2
fYear :
2004
fDate :
1-5 Sept. 2004
Firstpage :
3031
Lastpage :
3034
Abstract :
We investigated Bayesian network structure learning and probability estimation from mammographic feature data in order to classify breast lesions into different pathological categories. We compared the learned networks to naive Bayes classifiers, which are similar to the expert systems previously investigated for breast lesion classification. The learned network structures reflect the difference in the classification of biopsy outcome and the invasiveness of malignant lesions for breast masses and microcalcifications. The difference between masses and microcalcifications should be taken into consideration when interpreting systems for automatic pathological classification of breast lesions. The difference may also affect use of these systems for tasks such as estimating the sampling error of biopsy.
Keywords :
Markov processes; Monte Carlo methods; belief networks; cancer; image classification; learning (artificial intelligence); mammography; medical expert systems; medical image processing; probability; tumours; BI-RADS descriptor; Bayesian network structure learning; Markov chain; Monte Carlo method; automatic pathological classification; biopsy; breast cancer; breast lesion classification; expert systems; mammography; microcalcifications; naive Bayes classifiers; probability estimation; sampling error estimation; Bayesian methods; Biomedical engineering; Breast cancer; Joining processes; Lesions; Mammography; Monte Carlo methods; Pathology; Radiology; Skin cancer; Bayesian network; breast cancer; classification; mammography; markov chain monte carlo;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
Type :
conf
DOI :
10.1109/IEMBS.2004.1403858
Filename :
1403858
Link To Document :
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