An Internal Voltage Generation System of Flash Memory Module Embedded in a Microcontroller

We present a new internal voltage generation system of flash memory module embedded in a microcontroller. One of the features is wide range voltage generator for the evaluation of the memory cell, which is effective mainly at the development early stage. The second feature is new temperature dependency voltage generator matched to memory cell property for the improvement of reliability. The third is an auto-trimming system that arranges output of internal voltage generators with target values. Using embedded CPU the auto-trimming system suppresses voltage variations for many chips simultaneously, so we can reduce test cost and improve reliability of flash memory module in the stage of mass production