DocumentCode
2736425
Title
Fast and precise resistance characterisation of laser drilled and metallized vias
Author
Menkoe, Michael ; Reitenbach, Hermann ; Hoenig, Rene ; Clement, Florian ; Biro, Daniel ; Preu, Ralf
Author_Institution
Fraunhofer Inst. for Solar Energy Syst. (ISE), Freiburg, Germany
fYear
2010
fDate
20-25 June 2010
Abstract
Concerning cell concepts using metallized vias for the interconnection between the front- and the rear side in general, for example the MWT (Metal Wrap Through) concept, via resistance losses have a high impact on cell performance. Hence, establishing a fast, precise and reliable characterization instrument allowing a faster development of metallization pastes and hole drilling processes is the purpose of this work.
Keywords
laser beam applications; metallisation; solar cells; contact unit; hole drilling process; laser drilled vias; laser metallized vias; measurement unit; metallization pastes; precise measurement; precise resistance; solar cell; through-hole contact; viatester; Current measurement; Electrical resistance measurement; Geometry; Measurement by laser beam; Metallization; Probes; Resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614396
Filename
5614396
Link To Document