Modeling of internal reflections and diffraction in SAW transducers

Author

Männer, O. ; Visintini, G. ; Ruile, W.

Author_Institution

SIEMENS AG Osterreich, Vienna, Austria

fYear

1990

fDate

4-7 Dec 1990

Firstpage

77

Abstract

A method for the combined simulation of electrode reflections and diffraction in surface acoustic wave (SAW) filters is presented. The electrode reflections are modeled with a mixed nodal impedance/scattering paramenter (MNS) formalism which is based on a P-matrix analysis. Field-shorting and mass-loading reflections as well as end effects are taken into account. The results of this calculation are used to define frequency- and position-dependent excitation strengths for the sources within the transducer. These source strengths are used in an extended angular-spectrum-of-waves model. The improved accuracy of this approach is demonstrated for a broadband delay line and a bandpass filter

Keywords

band-pass filters; piezoelectric transducers; surface acoustic wave filters; ultrasonic delay lines; ultrasonic diffraction; ultrasonic reflection; ultrasonic transducers; P-matrix analysis; SAW filters; SAW transducers; angular-spectrum-of-waves model; bandpass filter; broadband delay line; electrode diffraction; electrode reflections; end effects; field shorting reflections; frequency dependent excitation strengths; internal reflections; mass-loading reflections; mixed nodal impedance scattering parameter formalism; model; position-dependent excitation strengths; simulation; Acoustic diffraction; Acoustic reflection; Acoustic scattering; Acoustic transducers; Acoustic waves; Electrodes; Filters; Frequency; Surface acoustic waves; Surface impedance;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1990. Proceedings., IEEE 1990

Conference_Location

Honolulu, HI

Type

conf

DOI

10.1109/ULTSYM.1990.171329

Filename

171329