Title :
On-Chip High-Voltage Charge Pump Circuit in Standard CMOS Processes With Polysilicon Diodes
Author :
Ker, Ming-Dou ; Chen, Shih-Lun
Author_Institution :
Inst. of Electron., National Chiao-Tung Univ., Hsinchu
Abstract :
An on-chip high-voltage charge pump circuit realized with the polysilicon diodes in standard (bulk) CMOS process is presented in this paper. Because the polysilicon diodes are fully isolated from the substrate, the output voltage of the charge pump circuit is not limited by the junction breakdown voltage of MOSFETs. The polysilicon diodes can be implemented in the standard CMOS processes without extra process steps. The proposed charge pump circuit has been fabricated in a 0.25-mum 2.5-V standard CMOS process. The output voltage of the 12-stage charge pump circuit can be pumped up to 28.08 V, which is much higher than the n-well/p-substrate breakdown voltage (18.9 V) in a 0.25-mum 2.5-V standard CMOS process
Keywords :
CMOS integrated circuits; MOSFET circuits; integrated circuit design; power electronics; semiconductor device breakdown; semiconductor diodes; 0.25 micron; 18.9 V; 2.5 V; MOSFET; bulk CMOS process; charge pump circuit; junction breakdown voltage; polysilicon diodes; substrate; Anodes; Breakdown voltage; CMOS process; Cathodes; Charge pumps; Circuits; MOS devices; Semiconductor diodes; Silicon on insulator technology; System-on-a-chip;
Conference_Titel :
Asian Solid-State Circuits Conference, 2005
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-9163-2
Electronic_ISBN :
0-7803-9163-2
DOI :
10.1109/ASSCC.2005.251689