• DocumentCode
    2736668
  • Title

    Using silicon injection phenomenon during fire-through contact formation to improve process control and performance of screen-printed multicrystalline-silicon solar cells

  • Author

    Sopori, Bhushan ; Mehta, Vishal ; Reedy, Robert

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    High-performing screen printed, fire-through Si solar cells require a uniform, about 10-μm-thick, back surface field (BSF), with a peak Al concentration of about 1018 cm-3. This entails forming an ~30-μm-thick Si-Al melt, which initiates sporadically and tends to agglomerate and ball up, thus producing a non-uniform BSF. We have developed a method to stabilize the Si-Al melt by deploying Si injection (at about 550°C for 2-5 s) during ramp-up, which initiates a thin, uniform melt along the entire Si-Al interface. This promotes adhesion between the Si surface and the growing Al-Si melt. We have previously shown that this process produces an excellent back contact, but the quality of the front contact and overall cell efficiency were not evaluated. The primary concern was whether molten glass frit would rapidly react with SiN:H and etch away a significant thickness of N+ silicon. Here, we report that high-efficiency cells with a uniform BSF, an open-circuit voltage >620 mV, and short-circuit current density >32 mA/cm2 can be produced by a T-t firing profile that includes Si injection.
  • Keywords
    silicon; solar cells; thick films; Si; back surface field; fire-through contact formation; process control; screen-printed multicrystalline-silicon solar cells; short-circuit current density; silicon injection phenomenon; Fires; Firing; Glass; Metals; Photovoltaic cells; Silicon; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614411
  • Filename
    5614411