DocumentCode :
2736757
Title :
Testing the enterprise IBM System/390TM multi processor
Author :
Torreiter, Otto A. ; Baur, Ulrich ; Goecke, Georg ; Melocco, Kevin
Author_Institution :
IBM Deutschland GmbH, Boeblingen, Germany
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
115
Lastpage :
123
Abstract :
This paper describes the test generation strategies, novel test generation techniques and the tester strategy for testing the IBM System/390TM Generation-3 Enterprise System Multi-Processor Module. The paper provides a review of the key test methodologies and a review of actual test results as seen at the product tester
Keywords :
CMOS digital integrated circuits; application specific integrated circuits; automatic test equipment; automatic testing; computer testing; integrated circuit testing; logic testing; microprocessor chips; multichip modules; multiprocessing systems; Generation-3 Enterprise System Multi-Processor Module; IBM System/390 multiprocessor; MCM; VLSI CMOS ASIC; chip wafer test; interconnect test data generation; logic model; shift register; testing; Automatic testing; Circuit testing; Clocks; Latches; Logic testing; Pins; Signal generators; Strontium; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639602
Filename :
639602
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2736757
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