DocumentCode :
2736815
Title :
On Empirical Bayes Procedures for Selecting the Best Manufacturing Process Based on Process Capability Index
Author :
Huang, Wen-Tao ; Lai, Yao-Tsung
Author_Institution :
Tamkang Univ., Taipei
fYear :
2007
fDate :
5-7 Sept. 2007
Firstpage :
244
Lastpage :
244
Abstract :
Consider k (k ges 2) manufacturing processes whose process capability indices Cpw are denoted by Cpw(i), i = 1, ldrldrldr, k all unknown. For a given control value Cpw(0), we are interested in selecting some manufacturing process whose process capability index is the largest in the qualified subset in which each process capability index is no less than Cpw(0). In this paper, under a Bayes framework, we focus on the normally distributed manufacturing processes taking normal-gamma as its conjugate prior. A Bayes approach is set up and an empirical Bayes procedure is proposed which has been shown to be asymptotically optimal. A simulation study is carried out for the performance of the proposed procedure and it is found satisfactory.
Keywords :
Bayes methods; manufacturing processes; manufacturing systems; process capability analysis; Bayes procedures; distributed manufacturing process; process capability index; Decision making; Gaussian distribution; Manufacturing industries; Manufacturing processes; Production; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Computing, Information and Control, 2007. ICICIC '07. Second International Conference on
Conference_Location :
Kumamoto
Print_ISBN :
0-7695-2882-1
Type :
conf
DOI :
10.1109/ICICIC.2007.415
Filename :
4427889
Link To Document :
بازگشت