• DocumentCode
    2736830
  • Title

    A Goodness-of-Fit Test for GEE Models with Binary Longitudinal Data Based on Smoothing Methods

  • Author

    Lin, Kuo-Chin ; Chen, Yi-Ju

  • Author_Institution
    Tainan Univ. of Technol., Tainan
  • fYear
    2007
  • fDate
    5-7 Sept. 2007
  • Firstpage
    245
  • Lastpage
    245
  • Abstract
    The logistic regression models have received widespread use for analyzing binary response data. In longitudinal studies, correlated data arise and such data are often analyzed by generalized estimating equations (GEE) method. This article proposes an alternative goodness-of-fit test based on nonparametric smoothing approach for assessing the adequacy of GEE fitted models, which can be regarded as an extension of the goodness-of-fit test of le Cessie and van Houwelingen (1991). The approximate expectation and variance of the proposed test statistic are derived. The power performance of test is discussed by simulation study and the testing procedure is illustrated by a clinical trial example.
  • Keywords
    data analysis; regression analysis; smoothing methods; GEE method; binary response data; generalized estimating equations method; goodness-of-fit test; logistic regression models; nonparametric smoothing approach; Covariance matrix; Data analysis; Equations; Logistics; Medical tests; Parameter estimation; Smoothing methods; Statistical analysis; Technology management; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Computing, Information and Control, 2007. ICICIC '07. Second International Conference on
  • Conference_Location
    Kumamoto
  • Print_ISBN
    0-7695-2882-1
  • Type

    conf

  • DOI
    10.1109/ICICIC.2007.28
  • Filename
    4427890