DocumentCode
2736830
Title
A Goodness-of-Fit Test for GEE Models with Binary Longitudinal Data Based on Smoothing Methods
Author
Lin, Kuo-Chin ; Chen, Yi-Ju
Author_Institution
Tainan Univ. of Technol., Tainan
fYear
2007
fDate
5-7 Sept. 2007
Firstpage
245
Lastpage
245
Abstract
The logistic regression models have received widespread use for analyzing binary response data. In longitudinal studies, correlated data arise and such data are often analyzed by generalized estimating equations (GEE) method. This article proposes an alternative goodness-of-fit test based on nonparametric smoothing approach for assessing the adequacy of GEE fitted models, which can be regarded as an extension of the goodness-of-fit test of le Cessie and van Houwelingen (1991). The approximate expectation and variance of the proposed test statistic are derived. The power performance of test is discussed by simulation study and the testing procedure is illustrated by a clinical trial example.
Keywords
data analysis; regression analysis; smoothing methods; GEE method; binary response data; generalized estimating equations method; goodness-of-fit test; logistic regression models; nonparametric smoothing approach; Covariance matrix; Data analysis; Equations; Logistics; Medical tests; Parameter estimation; Smoothing methods; Statistical analysis; Technology management; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovative Computing, Information and Control, 2007. ICICIC '07. Second International Conference on
Conference_Location
Kumamoto
Print_ISBN
0-7695-2882-1
Type
conf
DOI
10.1109/ICICIC.2007.28
Filename
4427890
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