• DocumentCode
    2737062
  • Title

    A Wide Lock-in Range PLL using Self-Calibrating Technique for Processors

  • Author

    Nakanishi, Jingo ; Notani, Hiromi ; Makino, Hiroshi ; Shinohara, Hirofumi

  • Author_Institution
    Dept. of Adv. Design Framework Dev., Renesas Technol. Corp., Itami
  • fYear
    2005
  • fDate
    1-3 Nov. 2005
  • Firstpage
    285
  • Lastpage
    288
  • Abstract
    A wide lock-in range PLL using a self-calibrating technique is proposed. This technique realizes a wide lock-in range and good jitter characteristics by performing the digital calibration at the start of the operation. However, self-calibration with a large number of digital control steps increases the test costs and circuit scale. In this paper, by estimating the margin for self-calibrating operation, the minimum number of digital control steps was determined. A PLL with a low test cost, a wide lock-in range and low jitter was designed and implemented using a 0.15 mum 1.5 V CMOS process. The measured PLL lock-in range is 80 MHz - 630 MHz with four digital calibration steps. The peak-to-peak jitter at 380 MHz is 100 ps
  • Keywords
    CMOS digital integrated circuits; UHF integrated circuits; VHF circuits; calibration; digital control; microprocessor chips; phase locked loops; 0.15 micron; 1.5 V; 80 to 630 MHz; CMOS process; digital calibration; digital control steps; lock-in range PLL; phase locked loop; processors; self-calibration; Calibration; Circuit testing; Costs; Digital control; Frequency; Jitter; Large scale integration; Phase locked loops; Voltage; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Solid-State Circuits Conference, 2005
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-9162-4
  • Electronic_ISBN
    0-7803-9163-2
  • Type

    conf

  • DOI
    10.1109/ASSCC.2005.251721
  • Filename
    4017587