DocumentCode :
2737062
Title :
A Wide Lock-in Range PLL using Self-Calibrating Technique for Processors
Author :
Nakanishi, Jingo ; Notani, Hiromi ; Makino, Hiroshi ; Shinohara, Hirofumi
Author_Institution :
Dept. of Adv. Design Framework Dev., Renesas Technol. Corp., Itami
fYear :
2005
fDate :
1-3 Nov. 2005
Firstpage :
285
Lastpage :
288
Abstract :
A wide lock-in range PLL using a self-calibrating technique is proposed. This technique realizes a wide lock-in range and good jitter characteristics by performing the digital calibration at the start of the operation. However, self-calibration with a large number of digital control steps increases the test costs and circuit scale. In this paper, by estimating the margin for self-calibrating operation, the minimum number of digital control steps was determined. A PLL with a low test cost, a wide lock-in range and low jitter was designed and implemented using a 0.15 mum 1.5 V CMOS process. The measured PLL lock-in range is 80 MHz - 630 MHz with four digital calibration steps. The peak-to-peak jitter at 380 MHz is 100 ps
Keywords :
CMOS digital integrated circuits; UHF integrated circuits; VHF circuits; calibration; digital control; microprocessor chips; phase locked loops; 0.15 micron; 1.5 V; 80 to 630 MHz; CMOS process; digital calibration; digital control steps; lock-in range PLL; phase locked loop; processors; self-calibration; Calibration; Circuit testing; Costs; Digital control; Frequency; Jitter; Large scale integration; Phase locked loops; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Solid-State Circuits Conference, 2005
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-9162-4
Electronic_ISBN :
0-7803-9163-2
Type :
conf
DOI :
10.1109/ASSCC.2005.251721
Filename :
4017587
Link To Document :
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