DocumentCode :
2737189
Title :
Mismatch Modeling and Simulation Methodology for Predicting the Output Voltage Variation of an LCD Driver
Author :
Hoshino, Kozo ; Shimomura, Narakazu
Author_Institution :
Integrated Circuit Group, Sharp Corp., Tenri
fYear :
2005
fDate :
Nov. 2005
Firstpage :
317
Lastpage :
320
Abstract :
This paper presents a new mismatch modeling and simulation methodology for predicting the output voltage variation of an LCD (liquid crystal display) driver. The new model is especially effective for MV (medium voltage) MOSFETs which have a drift resistance region in the source/drain areas on both sides of the gate electrode. The new model takes into account the effect of drift resistance on the mismatch properties of the threshold voltage and the current gain. As a result, the model shows high precision over a wide range of transistor sizes and bias conditions. Circuit level SPICE simulation results show a better prediction for the output voltage variation than previous approaches
Keywords :
MOSFET circuits; SPICE; circuit simulation; driver circuits; liquid crystal displays; LCD driver; SPICE simulation; liquid crystal display; medium voltage MOSFET; mismatch modeling; mismatch simulation; output voltage prediction; Circuit simulation; Driver circuits; Electrodes; Integrated circuit modeling; Liquid crystal displays; MOSFETs; Medium voltage; Predictive models; SPICE; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Solid-State Circuits Conference, 2005
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-9163-2
Electronic_ISBN :
0-7803-9163-2
Type :
conf
DOI :
10.1109/ASSCC.2005.251729
Filename :
4017595
Link To Document :
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