DocumentCode :
2737257
Title :
Design of a properly scaled 100 nm pseudomorphic HEMT using H2F
Author :
Asenov, A. ; Babiker, S. ; Cameron, N. ; Beaumont, S.P. ; Barker, J.R.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear :
1995
fDate :
34792
Firstpage :
42552
Lastpage :
42557
Abstract :
In this paper we report on a systematic approach to the design of 100 nm gate length PHEMT using full scale 2D simulation with the recently developed Heterojunction 2D Finite element semiconductor device simulator H2F. The design approach involves four stages: fabrication of pilot devices; validation of the simulator against measured characteristics of these devices; redesign and optimisation of the vertical layer structure based on extensive simulation of 100 nm gate length devices, and finally fabrication of the optimised 100 nm PHEMTs and iterative improvements
Keywords :
finite element analysis; high electron mobility transistors; semiconductor device models; 100 nm; H2F; design; device scaling; heterojunction 2D finite element semiconductor device simulator; iteration; optimisation; pseudomorphic HEMT;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Physical Modelling of Semiconductor Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19950432
Filename :
478370
Link To Document :
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