Title :
Experiences with implementation of IDDQ test for identification and automotive products
Author :
Arnold, Ralf ; Bode, Thorsten ; Feuser, Markus ; Wedekind, Horst-Udo
Author_Institution :
Philips Semicond., Hamburg, Germany
Abstract :
Quality improvements for CMOS devices by using IDDQ/I SSQ tests are a popular topic since early 1990s. This is a report about experiences with the implementation of novel IDDQ test methods for Identification & Automotive products at Philips Semiconductors. The aim is to describe the considerations, quality assurance strategy and its realization for Identification & Automotive products like Smart Card Controller ICs for Chip Cards and Radio Frequency Transponders for contactless car immobilization systems considering special security requirements. The main issue of Philips quality strategy is to achieve a better overall quality without sacrificing device costs. In addition to the test aspects some organizational, design, library, Computer Aided Test software, production and other quality & reliability related issues are covered
Keywords :
CMOS integrated circuits; alarm systems; automatic testing; automotive electronics; economics; electric current measurement; identification; integrated circuit testing; reliability; CMOS devices; Chip Cards; Computer Aided Test software; IDDQ test; ISSQ tests; Philips Semiconductors; Philips quality strategy; Radio Frequency Transponders; Smart Card Controller ICs; automotive products; contactless car immobilization systems; identification; quality; quality assurance strategy; reliability; security requirements; Automotive engineering; Control systems; Quality assurance; Radio control; Radio frequency; Radiofrequency identification; Semiconductor device testing; Smart cards; Software testing; Transponders;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639605
