• DocumentCode
    2737323
  • Title

    A Novel Three Dimensional Field Effect Transistor Based on Single-Walled Carbon Nanotubes

  • Author

    Selvarasah, Selvapraba ; Makaram, Prashanth ; Chen, Chia-Ling ; Pan, Huiyan ; Busnaina, Ahmed ; Dokmeci, Mehmet R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    18
  • Lastpage
    21
  • Abstract
    We present the design, fabrication and testing of a novel three dimensional (3D) Field Effect Transistor based on Single-Walled Carbon Nanotubes (SWNTs). Three Dimensional SWNT transistors are realized utilizing low temperature Dielectrophoretic (DEP) assembly. A 1mum thick conformal Parylene-C (poly-para-xylylene) layer is utilized as the gate dielectric with a non-local top gate electrode around the conducting channel. The preliminary results from 3D Carbon NanoTube Field Effect Transistors (CNTFET) display ambipolar behavior with more prominent p-type than n-type behavior. The transistor exhibits an on-to-off current ratio of ~3 x 104, a maximum transconductance of 0.061 mus, and a mobility of 85- 277 cm2/Vs. This 3D-CNTFET technology can be utilized to realize multi layer, compact and high density nanotube transistors for large scale nanoelectronic circuits.
  • Keywords
    carbon nanotubes; electrodes; electrophoresis; field effect transistors; 3D SWNT transistors; 3D carbon nanotube field effect transistors; 3D-CNTFET technology; ambipolar behavior; conducting channel; conformal Parylene-C layer; gate dielectric; low temperature dielectrophoretic assembly; nonlocal top gate electrode; poly-para-xylylene layer; single-walled carbon nanotubes; Assembly; CNTFETs; Carbon nanotubes; Dielectrics; Dielectrophoresis; Electrodes; FETs; Fabrication; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.14
  • Filename
    4616996