Title :
Test procedure development for automotive conducted susceptibility and conducted emissions
Author :
Moy, Kin P. ; Sperber, William
Author_Institution :
General Motors Corp., Warren, OH, USA
Abstract :
Current work on electromagnetic compatibility (EMC) requirements for automotive electronic and electrical components has necessitated the development of certain test procedures and specifications for EMC testing within General Motors. In order to support this effort, a study was performed to characterize the internal electromagnetic environment of the automobile. The authors describe the conducted susceptibility and conducted emissions test procedure and specification development in General Motors. The status of the development of similar test procedures in the Society of Automotive Engineers and International Standard Organization is also discussed. The test methods, where possible, harmonize with both national and international standards. Through these procedures correlation of component tests to the automobile´s internal electromagnetic environment was established. Confirmation of site-to-site repeatability and device-to-device repeatability was accomplished. Test configurations were defined to ensure test uniformity and repeatability. Waveform severity levels were identified and recommended with the understanding that the final decision for severity-level specifications is the responsibility of the customer. The tests were primarily developed to be used during the design and development stages of components. In such cases, it is recommended that additional analytical methods such as frequency-domain analysis be used
Keywords :
automotive electronics; electromagnetic compatibility; electromagnetic interference; EMC testing; EMI; General Motors; automotive electronic; component tests; conducted emissions; conducted susceptibility; frequency-domain analysis; standards; Automobiles; Automotive electronics; Automotive engineering; Electromagnetic compatibility; Electronic components; Electronic equipment testing; ISO standards; Manufacturing; System testing; Vehicles;
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/NSEMC.1989.37191