DocumentCode
2737853
Title
Current signatures: application
Author
Gattiker, Anne E. ; Maly, Wojciech
Author_Institution
Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
156
Lastpage
165
Abstract
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under the condition that an appropriate current-signature-based test methodology is developed. This paper is a first step toward such a goal. It is focused on current signature step detection in a noisy test environment. Application of current signatures in die selection and defect diagnosis is discussed as well
Keywords
CMOS integrated circuits; electric current measurement; fault location; integrated circuit testing; production testing; random noise; CMOS; IC technology; Iddq testing; current signature; defect diagnosis; die selection; noisy test environment; step detection; Costs; Current measurement; Frequency; Integrated circuit noise; Integrated circuit testing; Life testing; Noise measurement; Transistors; Voltage; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639608
Filename
639608
Link To Document