• DocumentCode
    2738107
  • Title

    FPGA Prototype for WLAN OFDM Baseband with STPE of I/Q Mismatch Self Calibration Algorithm

  • Author

    Hsu, Chia-Hung ; Wu, Chih-Feng ; Wang, Chorng-Kuang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2005
  • fDate
    Nov. 2005
  • Firstpage
    509
  • Lastpage
    512
  • Abstract
    Based on the single tone power evaluation (STPE), a self-calibration algorithm of I/Q mismatch is proposed for the IEEE 802.11a WLAN systems. The self-calibration algorithm is performed by the digital baseband at transceiver start-up to measure the signal power of the single tone signal, which is located at the double frequency band at the receiver. Furthermore, the residual I/Q mismatch is tracked during the physical data transmission. Therefore, the design requirements of the RF front-end for the WLAN OFDM transceiver are alleviated. According to the proposed algorithm, the residual signal-to-noise ratio (SNR) degradation is totally less than 0.5-dB with plusmn5% gain mismatch (DeltaG) and plusmn5deg phase mismatch (Deltathetas) in the transmitter and receiver respectively, and carrier frequency offset (CFO = plusmn232kHz). Finally, the prototype of the IEEE 802.11a WLAN baseband is realized by the Altera Stratix EP1S80 DSP development board with about 32000 logic elements at 40MHz
  • Keywords
    IEEE standards; OFDM modulation; digital signal processing chips; field programmable gate arrays; logic gates; transceivers; wireless LAN; 40 MHz; Altera Stratix EP1S80 DSP; FPGA prototype; I/Q mismatch self calibration algorithm; IEEE 802.11a; OFDM transceiver; WLAN systems; carrier frequency offset; logic elements; physical data transmission; signal-to-noise ratio degradation; single tone power evaluation; Baseband; Calibration; Field programmable gate arrays; Frequency measurement; OFDM; Performance evaluation; Power measurement; Prototypes; Transceivers; Wireless LAN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Solid-State Circuits Conference, 2005
  • Conference_Location
    Hsinchu
  • Print_ISBN
    0-7803-9163-2
  • Electronic_ISBN
    0-7803-9163-2
  • Type

    conf

  • DOI
    10.1109/ASSCC.2005.251789
  • Filename
    4017643