DocumentCode
2738297
Title
A New Method for Microwave Characterization of Metallic Single-Walled Carbon Nanotubes
Author
Song, Chunrong ; Liu, Zuqin ; Eres, Gyula ; Geohegan, David B. ; Wang, Pingshan
Author_Institution
Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
228
Lastpage
229
Abstract
On-chip subtraction of capacitive parasitic effects is proposed for microwave characterization of individual metallic single-walled carbon nanotube (mSWNT) that yields low intensity signals. The method dramatically reduces capacitive parasitic effects to uncover the otherwise buried signals. Both computer simulations and experimental measurements of small capacitance demonstrated the efficacy of the approach.
Keywords
carbon nanotubes; electrical conductivity; microwave spectra; nanotechnology; C; capacitive parasitic effects; metallic single-walled carbon nanotubes; microwave characterization; on-chip subtraction; small capacitance; Capacitance measurement; Carbon nanotubes; Circuit testing; Materials science and technology; Microwave theory and techniques; Parasitic capacitance; Power dividers; Power transmission lines; Scattering parameters; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.74
Filename
4617056
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