DocumentCode :
2738393
Title :
Automated Removal of Metallic Carbon Nanotubes in a Nanotube Ensemble by Electrical Breakdown
Author :
Amlani, Islamshah ; Pimparkar, Ninad ; Nordquist, Kevin ; Lim, Derrick ; Clavijo, Sergio ; Qian, Zhengfang ; Emrick, Rudy
Author_Institution :
Motorola Labs., Tempe, AZ
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
239
Lastpage :
242
Abstract :
We present an automated electrical burning process to selectively eliminate conducting paths due to metallic and high-leakage ambipolar single-walled carbon nanotubes in aligned and randomly networked configurations of varying dimensions. Our algorithm is hysterisis immune and adjusts gate bias in between successive burn pulses to facilitate optimized electrical burning results. In back-gated devices, we show improvements in on/off ratio better than three orders of magnitude while achieving on-state current reduction of less than 25%. We also discuss important considerations that must be taken into account for obtaining good electrical burning results in top-gated devices.
Keywords :
carbon nanotubes; electric breakdown; field effect transistors; nanotube devices; semiconductor nanotubes; C; back-gated devices; electrical breakdown; electrical burning; gate bias; high-leakage ambipolar single-walled carbon nanotubes; metallic carbon nanotubes; nanotube ensemble; on-state current reduction; top-gated devices; Atomic measurements; Carbon nanotubes; Dielectric substrates; Electric breakdown; Electrodes; Force measurement; Nanoscale devices; Semiconductivity; USA Councils; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, Texas
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.78
Filename :
4617060
Link To Document :
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