• DocumentCode
    2738393
  • Title

    Automated Removal of Metallic Carbon Nanotubes in a Nanotube Ensemble by Electrical Breakdown

  • Author

    Amlani, Islamshah ; Pimparkar, Ninad ; Nordquist, Kevin ; Lim, Derrick ; Clavijo, Sergio ; Qian, Zhengfang ; Emrick, Rudy

  • Author_Institution
    Motorola Labs., Tempe, AZ
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    239
  • Lastpage
    242
  • Abstract
    We present an automated electrical burning process to selectively eliminate conducting paths due to metallic and high-leakage ambipolar single-walled carbon nanotubes in aligned and randomly networked configurations of varying dimensions. Our algorithm is hysterisis immune and adjusts gate bias in between successive burn pulses to facilitate optimized electrical burning results. In back-gated devices, we show improvements in on/off ratio better than three orders of magnitude while achieving on-state current reduction of less than 25%. We also discuss important considerations that must be taken into account for obtaining good electrical burning results in top-gated devices.
  • Keywords
    carbon nanotubes; electric breakdown; field effect transistors; nanotube devices; semiconductor nanotubes; C; back-gated devices; electrical breakdown; electrical burning; gate bias; high-leakage ambipolar single-walled carbon nanotubes; metallic carbon nanotubes; nanotube ensemble; on-state current reduction; top-gated devices; Atomic measurements; Carbon nanotubes; Dielectric substrates; Electric breakdown; Electrodes; Force measurement; Nanoscale devices; Semiconductivity; USA Councils; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.78
  • Filename
    4617060