• DocumentCode
    2738406
  • Title

    A fuzzy logic application to represent load sensitivity to voltage sags

  • Author

    Bonatto, B.D. ; Niimura, T. ; Dommel, H.W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    1
  • fYear
    1998
  • fDate
    14-18 Oct 1998
  • Firstpage
    60
  • Abstract
    This paper presents a case study application of fuzzy logic in a power quality issue. It describes the computer-based load sensitivity to voltage sags, by using fuzzy sets and IF-THEN inference rules. The load sensitivity is based on the steady-state and transient voltage versus time profile according to the IEEE Std. 446, also referred to as the CBEMA (Computer Based Equipment Manufacturer Association) curve. Fuzzy logic allows the modeling of the inherent uncertainty of the load reliability. This expresses how the success or failure of computer based loads is correlated with short term voltage variations in the electric supply system. A fuzzy inference system is experimentally implemented for these cases, showing the general procedures of how to use this theory. It appears that fuzzy set theory can play an important role in diagnosing power quality disturbances, and hence it can offer insights towards the satisfaction of the needs of manufacturers, utilities and customers
  • Keywords
    computer power supplies; fuzzy logic; fuzzy set theory; inference mechanisms; power supply quality; power system faults; IF-THEN inference rules; case study application; computer power supply; fuzzy logic application; fuzzy sets; load reliability uncertainty; load sensitivity; power quality; power quality disturbance diagnosis; voltage sags; Application software; Computer aided manufacturing; Fuzzy logic; Fuzzy set theory; Fuzzy sets; Fuzzy systems; Power quality; Steady-state; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Harmonics and Quality of Power Proceedings, 1998. Proceedings. 8th International Conference On
  • Conference_Location
    Athens
  • Print_ISBN
    0-7803-5105-3
  • Type

    conf

  • DOI
    10.1109/ICHQP.1998.759840
  • Filename
    759840