Title :
Electron Transport Across Interfaces in Horizontal Carbon Nanofiber Interconnects
Author :
Yamada, T. ; Suzuki, M. ; Kitsuki, H. ; Saito, T. ; Fabris, D. ; Sun, X. ; Wilhite, P. ; Yang, C.Y.
Author_Institution :
Center for Nanostruct., Santa Clara Univ., Santa Clara, CA
Abstract :
In a carbon nanofiber (CNF) metal contact such as a bridge between two metallic electrodes, passing high current (current stressing) reduces the total resistance of the system (CNF resistance RCNF and contact resistance Rc) by orders of magnitude. The role of current stressing is modeled as a reduction in the interfacial tunneling gap with transport characteristics attributed to tunneling between Au and CNF. The model predicts a reduction in Rc and the nonlinearity in the current-voltage (I-V) characteristics gradually disappears as Rc decreases. These results are consistent with I-V behavior measured experimentally.
Keywords :
carbon fibres; contact resistance; gold; integrated circuit interconnections; nanostructured materials; semiconductor-metal boundaries; tunnelling; Au-C; carbon nanofiber-metal contact; contact resistance; current stressing; current-voltage characteristics; electron transport; horizontal carbon nanofiber interconnects; interfacial tunneling gap; metallic electrodes; Bridge circuits; Contact resistance; Current measurement; Electric breakdown; Electrical resistance measurement; Electrodes; Electrons; Gold; Tunneling; Voltage;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, Texas
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.84
